Scanning Electron Microscope

Scanning Electron Microscope Technical Specification

Scanning Electron Microscope support three window synchronous,two chanel (SE+BSE) with CCD window. Auto Function focus : bright/contrast, astigmation auto remove, electron beam centering, auto high voltage, auto filament, electron gun auto correction, faculty detection, optional 3D scanning etc.

Product Feature:

The SEM are magnification continuously adjustable, widly working distance, extended depth of field and easy to observe rough specimen, with these features, combine with STM/AFM to help with the location issue in STM/AFM.