Scanning Electron Microscope ECO With Accessories

Scanning Electron Microscope ECO With Accessories Manufacturer

The SEM are magnification continuously adjustable, widly working distance, extended depth of field and easy to observe rough specimen, with these features, combine with STM/AFM to help with the location issue in STM/AFM. SEM in charge of area selection, and then move the probe to the corresponding area for detailed imaging.The system can realize direct specimen observation from marcoscopical to microcosmic, milimeter to nanometer and roughen surface to smooth surface.

Product Feature:

Scanning electron microscope eco with accessories support five windows synchronous, four chanel (SE+BSE) with CCD window. Auto Function:focus, bright/contrast, astigmation auto remove, electron beam centering, auto high voltage, auto filament, electron gun auto correction, fauclty detection, optional 3D scanning etc. Image Resolution : 16384*16384 pixels. Image Format : BMP, GIF, TIF, JPG, MNG, ICO, CUR, TGA, PCX, JP2, JPC, PGX, RAS, PNM, SKA, SEM.